|
|
IBIS Behavioral Models:
Micron has been a member of the IBIS Open Forum for many years and fully supports the IBIS specification. IBIS models for most Micron products are available for download from the Micron Web site.
|
TN-00-07
|
11/2009
|
163.98 KB
|
Technical Note
|
|
|
Thermal Applications:
Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature
|
TN-00-08
|
05/2010
|
252.18 KB
|
Technical Note
|
|
|
Understanding Quality and Reliability Requirements for Bare Die Applications:
Describes the quality and reliability requirements for bare die applications
|
TN-00-14
|
10/2009
|
152.83 KB
|
Technical Note
|
|
|
Recommended Soldering Parameters:
Defines the recommended soldering techniques and parameters for Micron Technology, Inc., products.
|
TN-00-15
|
03/2007
|
69.09 KB
|
Technical Note
|
|
|
Uprating of Semiconductors for High-Temperature Applications:
Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer's environmental specifications
|
TN-00-18
|
05/2010
|
428.33 KB
|
Technical Note
|
|
|
Understanding Signal Integrity:
Describes how memory design, test, and verification tools can be used to the greatest advantage, from conception of a new product through end of life
|
TN-00-20
|
12/2009
|
1.52 MB
|
Technical Note
|
|
|
SEMI Wafer Map Format:
Micron has adopted the wafer map file format approved by Semiconductor Equipment and Materials International (SEMI). With SEMI formatting, Micron's customers can be confident they will always receive consistent, compatible, reliable map files.
|
TN-00-21
|
02/2009
|
110 KB
|
Technical Note
|
|
|
Thinning Considerations for Wafer Products:
Information on optimal wafer-thinning processes to meet specific customer requirements
|
TN-00-19
|
10/2009
|
73.58 KB
|
Technical Note
|
|
|
Design Guide for Two-DIMM, Unbuffered Systems:
DDR2-533 memory design guide for two-DIMM, unbuffered systems
|
TN-47-01
|
12/2009
|
614.72 KB
|
Technical Note
|
|
|
DDR2 SDRAM Offers New Features and Functionality:
Discusses the various changes in DDR2 technology and the resulting features and benefits
|
TN-47-02
|
12/2006
|
400.7 KB
|
Technical Note
|
|
|
Module Pinout Decoder:
Provides sorted pin assignment tables and pin location figures for use in DDR2 DIMM signal identification, tracing, and troubleshooting
|
TN-47-03
|
12/2004
|
215.46 KB
|
Technical Note
|
|
|
Calculating Memory System Power for DDR2:
Rev. B, Details how DDR2 SDRAM consumes power and provides tools to estimate power consumption in a given system
|
TN-47-04
|
03/2011
|
1.04 MB
|
Technical Note
|
|
|
Power Solutions for DDR2 Notebook PCs:
Technical note providing general guidelines for designing power circuitry for DDR2 memory. Includes the DDR2 voltage requirements and encompasses a sample reference design focused on the Texas Instruments Incorporated (TI) TPS51116 DDR2 memory power solution.
|
TN-47-05
|
04/2010
|
374.42 KB
|
Technical Note
|
|
|
DDR2 Simulation Support:
Covers DDR2 simulation, adding to Micron's extensive array of design support tools for system designers
|
TN-47-07
|
05/2005
|
127.84 KB
|
Technical Note
|
|
|
DDR2 Package Sizes and Layout Requirements:
Covers DDR2 package sizes and layout requirements
|
TN-47-08
|
11/2005
|
614.31 KB
|
Technical Note
|
|
|
DDR2 tCKE Power-Down Requirement:
Describes the tCKE timing parameter of DDR2 SDRAM.
|
TN-47-14
|
04/2010
|
102.03 KB
|
Technical Note
|
|
|
Designing for High-Density DDR2 Memory:
Focuses on designing for high-density memory—addressing schemes of each density, configurations, and the subtle differences between the 4-bank and new 8-bank DDR2 devices
|
TN-47-16
|
12/2009
|
284.38 KB
|
Technical Note
|
|
|
DDR2 SODIMM Optimized Address/Command Nets:
Provides the system-level designer with an overview of the DDR2 SODIMM family and offers insight into termination techniques utilized on the commands and addresses for these modules
|
TN-47-17
|
05/2005
|
592.56 KB
|
Technical Note
|
|
|
DDR2 (Point-to-Point) Features and Functionality:
Rev B. Focuses on the unique memory requirements of point-to-point design layouts and describes DDR2 features and functionality
|
TN-47-19
|
03/2011
|
706.41 KB
|
Technical Note
|
|
|
DDR2 (Point-to-Point) Package Sizes and Layout Basics:
General guidelines for developing the PCB floor plan
|
TN-47-20
|
06/2007
|
408.8 KB
|
Technical Note
|
|
|
FBDIMM Channel Utilization (Bandwidth and Power):
Newly introduced FBDIMMs offer virtually unlimited scalability of density, a significantly reduced number of routed motherboard signals, and high bandwidth solutions, all with an extremely reliable channel protocol
|
TN-47-21
|
12/2009
|
1.21 MB
|
Technical Note
|
|
|
Designing for 1.5V, Low-Power FBDIMMs:
Discusses memory power trends and identifies new low-voltage solutions for high-density DDR2 memory designs
|
TN-47-22
|
05/2008
|
980.89 KB
|
Technical Note
|
|
|
Server Memory Solutions for the Impending Data Center Power Crisis:
Facts about data center energy consumption and information about how to achieve significant power savings with Micron's low-voltage memory modules for servers.
|
White Paper
|
12/2009
|
309.03 KB
|
White Paper
|
|
|
PCN/EOL Systems:
Explains Micron's product change notification and end-of-life systems.
|
CSN-12
|
08/2009
|
75.58 KB
|
Customer Service Note
|
|
|
Wafer Packaging and Packaging Materials:
Provides complete shipping and recycling information about each of the materials used for shipping Micron's products.
|
CSN-20
|
09/2011
|
776.24 KB
|
Customer Service Note
|
|
|
Bare Die SiPs and MCMs:
Describes design considerations for bare die SiPs and MCMs.
|
CSN-18
|
04/2009
|
151.06 KB
|
Customer Service Note
|
|
|
Shipping Quantities:
Provides tables of part quantity.
|
CSN-04
|
10/2011
|
463.55 KB
|
Customer Service Note
|
|
|
Micron KGD Definitions:
Describes the testing specifications and parameters for Micron's KGD-C1 and KGD-C2 DRAM die.
|
CSN-22
|
07/2009
|
65.52 KB
|
Customer Service Note
|
|
|
Proper Handling Procedures for Modules:
Includes procedures for how to properly handle modules.
|
CSN-23
|
12/2007
|
1.02 MB
|
Customer Service Note
|
|
|
Micron Component and Module Packaging:
Explanation of Micron packaging labels and procedures.
|
CSN-16
|
02/2012
|
840.61 KB
|
Customer Service Note
|
|
|
ESD Precautions for Die/Wafer Handling and Assembly:
Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
|
CSN-24
|
08/2010
|
119.08 KB
|
Customer Service Note
|
|
|
Electronic Data Interchange:
Describes EDI transmission sets, protocol, and contacts.
|
CSN-06
|
09/2005
|
53.5 KB
|
Customer Service Note
|
|
|
RMA Procedures for Packaged Product and Bare Die Devices:
Outlines standard returned material authorization (RMA) procedures, as well as the differences associated with bare die RMAs.
|
CSN-07
|
10/2010
|
82.64 KB
|
Customer Service Note
|
|
|
ISO System Management Standards:
Describes ISO system management standards.
|
CSN-08
|
04/2004
|
39.18 KB
|
Customer Service Note
|
|
|
The Future of Memory and Storage:
Overview of trends for main memory and Flash memory
|
|
12/2009
|
1.54 MB
|
Presentation
|
|
|
DDR2 1.5V Memory:
Technical review
|
|
12/2009
|
548.95 KB
|
Presentation
|
|
|
Main Memory Technology Direction:
Technology trends, customer requirements, intro to DDR3
|
|
12/2009
|
531.53 KB
|
Presentation
|
|
|
DDR2 SDRAM System-Power Calculator:
|
|
01/2010
|
139 KB
|
Power Calculator
|
|
|
DRAM Component Part Numbering System:
Part numbering guide for DDR3/DDR2/DDR/SDR SDRAM, Mobile LPDRAM, and RLDRAM components
|
|
02/2012
|
39.77 KB
|
Part Numbering Guide
|
|
|
FBGA Date Codes:
Date codes for FBGA-packaged components
|
|
08/2005
|
22.36 KB
|
Part Numbering Guide
|
|
|
Accelerate Design Cycles with Simulation Models:
Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design.
|
TN-00-09
|
02/2010
|
206.91 KB
|
Technical Note
|
|
|
Design Guide - Dealing with DDR2/DDR3 Clock Jitter:
Explores DDR2/DDR3 clock jitter specifications and provides guidance on how to apply them and how to deal with violations
|
TN-04-56
|
09/2008
|
272.53 KB
|
Technical Note
|
|
|
Micron Wire-Bonding Techniques:
This technical note provides guidance on wire bonding techniques for both nickel-palladium (NiPd) and aluminum (Al) bond pads on Micron products.
|
TN-00-22
|
11/2010
|
66.13 KB
|
Technical Note
|
|
|
Industrial and Multi-Market Applications Flyer:
Our extensive and stable portfolio of IMM-focused memory solutions empower technology developments in automotive, industrial, medical, manufacturing, and other multi-market segments.
|
Product Flyer
|
08/2011
|
593.95 KB
|
Product Flyer
|
|
|
Micron BGA Manufacturer's User Guide:
Provides information to enable customers to easily integrate both leading-edge and legacy Micron's ball grid array (BGA) packages into their manufacturing processes. It is intended as a set of high-level guidelines and a reference manual describing typical package-related and manufacturing process-flow practices.
|
CSN-33
|
07/2011
|
353.32 KB
|
Customer Service Note
|
|
|
Product Marks/Product and Packaging Labels:
Explains product part marking, and product and packaging labels.
|
CSN-11
|
02/2012
|
666.83 KB
|
Customer Service Note
|
|
|
Bypass Capacitor Selection for High-Speed Designs:
Describes bypass capacitor selection for high-speed designs.
|
TN-00-06
|
03/2011
|
481.9 KB
|
Technical Note
|